Difference between pages "Converting Binary Plists" and "JTAG Forensics"

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(Created page with "== Definition == === From Wikipedia ([http://en.wikipedia.org/wiki/Joint_Test_Action_Group http://en.wikipedia.org/wiki/Joint_Test_Action_Group ]): === Joint Test Action Grou...")
 
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Binary plists are the files that Apple products use to store information. The easiest way to view them is to convert them to xml.
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== Definition ==
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=== From Wikipedia ([http://en.wikipedia.org/wiki/Joint_Test_Action_Group http://en.wikipedia.org/wiki/Joint_Test_Action_Group ]): ===
  
The program plutil is native to OSX (as of 10.2), however it is also included when iTunes is installed on a Windows PC.
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Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.
  
plutil on a Windows PC is stored in:
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=== Forensic Application ===
  
''Program Files (x86)\Common Files\Apple\Apple Application Support''
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JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.
  
Which can be added to the PATH in Environmental variables so plutil can be run from anywhere
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== Procedures ==
  
To convert Binary plists to XML run the command:
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* [[JTAG Samsung Galaxy S4 (SGH-I337)]]
'''plutil -convert xml1 file.plist'''
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== Links ==
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plutil man page - [[http://developer.apple.com/library/mac/#documentation/Darwin/Reference/ManPages/man1/plutil.1.html]]
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Revision as of 10:38, 6 August 2013

Definition

From Wikipedia (http://en.wikipedia.org/wiki/Joint_Test_Action_Group ):

Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.

Forensic Application

JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.

Procedures