Difference between pages "Talk:Windows Registry" and "JTAG Forensics"

From ForensicsWiki
(Difference between pages)
Jump to: navigation, search
(Bibliography)
 
 
Line 1: Line 1:
==Bibliography==
+
== Definition ==
[[User:Joachim Metz|Joachim]] 23:00, 12 March 2013 (PDT) The following links are broken. If you have a working one please put it back in the article and remove this one.
+
=== From Wikipedia ([http://en.wikipedia.org/wiki/Joint_Test_Action_Group http://en.wikipedia.org/wiki/Joint_Test_Action_Group ]): ===
* [http://www.pkdavies.co.uk/documents/Computer_Forensics/registry_examination.pdf Registry Examination] by Paul Davies
+
 
* [http://www.pkdavies.co.uk/downloads/registry_examination.pdf Forensic Analysis of the Windows Registry], by Peter Davies, Computer Forensics: Coursework 2 (student paper)
+
Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.
 +
 
 +
=== Forensic Application ===
 +
 
 +
JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.
 +
 
 +
== Tools and Equipment ==
 +
 
 +
* [[JTAG and Chip-Off Tools and Equipment]]
 +
 
 +
== Procedures ==
 +
 
 +
* [[JTAG HTC Wildfire S]]
 +
* [[JTAG LG P930]]
 +
* [[JTAG Samsung Galaxy S4 (SGH-I337)]]

Revision as of 22:23, 17 August 2013

Definition

From Wikipedia (http://en.wikipedia.org/wiki/Joint_Test_Action_Group ):

Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.

Forensic Application

JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.

Tools and Equipment

Procedures