Difference between revisions of "JTAG Forensics"

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* [[JTAG Huawei TracFone H866C]]
 
* [[JTAG Huawei TracFone H866C]]
 
* [[JTAG Huawei U8655]]
 
* [[JTAG Huawei U8655]]
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* [[JTAG Huawei Y301-A1 Valiant]]
 
* [[JTAG LG L45C TracFone]]
 
* [[JTAG LG L45C TracFone]]
 
* [[JTAG LG P930 (Nitro HD)]]
 
* [[JTAG LG P930 (Nitro HD)]]
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* [[JTAG LG E960 (Nexus 4)]]
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* [[JTAG Samsung Galaxy Centura (SCH-S738C)]]
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* [[JTAG Samsung Galaxy S3 (SGH-I747M)]]
 
* [[JTAG Samsung Galaxy S4 (SGH-I337)]]
 
* [[JTAG Samsung Galaxy S4 (SGH-I337)]]

Latest revision as of 17:16, 23 January 2014

Definition

From Wikipedia (http://en.wikipedia.org/wiki/Joint_Test_Action_Group ):

Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.

Forensic Application

JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.

Tools and Equipment

Procedures