Difference between pages "JTAG Huawei Tracfone M866C" and "JTAG Forensics"

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(Dkarpo moved page JTAG Huawei Tracfone M866C to JTAG Huawei TracFone M866C: Renaming to be consistent with the other TracFone JTAG docs.)
 
(Renamed Tracfone to TracFone to be consistent with other TracFone JTAG docs.)
 
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#REDIRECT [[JTAG Huawei TracFone M866C]]
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== Definition ==
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=== From Wikipedia ([http://en.wikipedia.org/wiki/Joint_Test_Action_Group http://en.wikipedia.org/wiki/Joint_Test_Action_Group ]): ===
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Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.
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=== Forensic Application ===
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JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.
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== Tools and Equipment ==
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* [[JTAG and Chip-Off Tools and Equipment]]
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== Procedures ==
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* [[JTAG HTC Wildfire S]]
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* [[JTAG Huawei TracFone M865C]]
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* [[JTAG Huawei TracFone M866C]]
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* [[JTAG Huawei U8655]]
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* [[JTAG LG L45C TracFone]]
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* [[JTAG LG P930 (Nitro HD)]]
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* [[JTAG Samsung Galaxy S4 (SGH-I337)]]

Revision as of 23:05, 14 September 2013

Definition

From Wikipedia (http://en.wikipedia.org/wiki/Joint_Test_Action_Group ):

Joint Test Action Group (JTAG) is the common name for what was later standardized as the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application. Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors support JTAG when they have enough pins. Embedded systems development relies on debuggers talking to chips with JTAG to perform operations like single stepping and breakpointing. Digital electronics products such as cell phones or a wireless access point generally have no other debug or test interfaces.

Forensic Application

JTAG forensics is an acquisition procedure which involves connecting to the Standard Test Access Port (TAPs) on a device and instructing the processor to transfer the raw data stored on connected memory chips. Jtagging supported phones can be an extremely effective technique to extract a full physical image from devices that cannot be acquired by other means.

Tools and Equipment

Procedures